Artificial Intelligence (AI) is rapidly entering semiconductor-test practice. Engineers are using vibe coding, AI-assisted development environments, agentic coding assistants, custom agents, MCP-style service interfaces, and task-specific AI applications to accelerate or rethink engineering workflows.

The AI in Test (AIT) Workshop invites session proposals that examine how AI may transform major areas of semiconductor test. This call is not for individual papers. Each accepted proposal will organize one focused workshop session around a significant application area, with the goal of providing practical clarity on technology readiness, ROI, reliability, workforce impact, and adoption strategy.

The workshop aims to move beyond both hype and fear. AI can produce impressive results quickly, but fast output does not necessarily mean that a problem has been solved reliably. At the same time, the speed of AI-generated results raises serious questions about job content, engineering roles, organizational investment, and future skill requirements.

Submission: Prospective organizers are invited to submit a 1-2 page PDF session proposal via the designated EasyChair platform. Sessions are expected to be 60 to 90 minutes in duration.

Scope: the goal of AIT is not to reach definitive answers or predict the future impact of AI on semiconductor testing, but to help the community identify the right questions to ask, the appropriate evaluation criteria to apply, and the key uncertainties that organizations must consider when making technology, investment, and workforce decisions.

Download the Call for Proposal!

Submit your session proposal!

"AI in Test” will take place in conjunction with the 2026 IEEE International Test Conference (ITC) and is sponsored by the IEEE Philadelphia Section in concurrence with the Test Technology Technical Council (TTTC) of IEEE Computer Society.